JTAG/Boundary Scan Controllers

Flexible and Scalable JTAG/Boundary Scan Hardware

A comprehensive and high-performance hardware platform is necessary to make full use of the possibilities provided by JTAG/Boundary Scan technology and the numerous new IEEE 1149.x and embedded system access standards.

Dedicated to meeting this challenge since 1991, GOEPEL electronic has the broadest and most powerful range of products currently available in the world – in the form of the SCANBOOSTER controller families, as well as the SCANFLEX and SCANFLEX II system platforms. Updates and upgrades ensure a secure longterm investment.

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High Performance Controller for Embedded Test and Programming

SCANFLEX II is the new generation of modular JTAG/Boundary Scan controllers. Based on the latest multi-core processors and FPGAs, SCANFLEX II opens new ways for the Embedded JTAG Solutions. The multifunctional architecture of the SCANFLEX II allows users to combine numerous technologies with high performance, an this on a single platform.


Low to midrange performance hardware

SCANBOOSTER II Provides an optimal solution, in particular for standard applications with lower performance requirements.


Modular, Flexible and Performance Scalable hardware.

JTAG/Boundary Scan system architecture SCANFLEX consists of three components: Controller, TAP Transceiver and I/O Module.
Available in three performance classes (A/B/C). Modular expandable TAP transceivers with a number of (up to 8) parallel, independent TAP and (up to 31) independent I/O modules, ensuring open scalability of required resources.

  • SPACE architecture for high performance scan and continuous burst operations
  • FASTSCALE technology software based upgrade of the controller’s performance class
  • ADYCS for signal path active delay compensation
  • HYSCAN™ for dynamic splitting and simultaneous execution of serial TAP vectors and parallel I/O vectors.

SCANFLEX systems are controlled through a JTAG/Boundary Scan Controller. This controller is responsible for simultaneous generation and dynamic distribution of serial patterns, parallel patterns, and control sequences, supporting three standard SFX and SFX/LS Interfaces.

All SCANFLEX Controllers are available in three performance classes (A/B/C).
The product portfolio is being constantly expanded. Customer specific products are offered upon request.

SCANFLEX II Controller
Configurations available for SCANFLEX II CUBE / SCANFLEX II BLADE 4 / SCANFLEX II BLADE 4 RMx3 (3 Controller)

SCANFLEX II Controller (SFX II BLADE 4) for GBit LAN and USB 3.0 for medium performance requirements
SCANFLEX II CUBE Controller for GBit LAN and USB 3
SCANFLEX II BLADE 4 / 8 Controller in 19″ box for medium and high performance requirements

Configuration overview of the new generation

Max. TCK Frequency 20 MHz 50 MHz 100 MHz
Data processing normal – Scan Data Buffer fast – SPACE™ III architecture (up to 20 times faster) fast – SPACE™ III architecture (up to 20 times faster)
Upgrade FASTSCALE™ (Upgrade to Controller B or C) FASTSCALE™ (Upgrade to Controller C)  

Extensions to the SCANFLEX II Controller
Systematically test the characteristics of a wide range of interfaces such as RS232, I2C and SPI or complex interfaces such as USB, LAN and media connections with the SFX II ITM (Interface Tester Master). The simultaneous interface test on several test objects is also supported.
See the “I/O Modules” tab for more info.

The SCANBOOSTER II complements the existing range of SCANFLEX II solutions in the lower and medium performance range and is used for JTAG/Boundary Scan testing, (C)PLD/FPGA programming and programming of Flash components such as NAND, NOR, SPI, I²C and eMMC.

SCANBOOSTER II is based on state-of-the-art multi-core processors and FPGA. This supports the synchronized execution of all embedded technologies in order to make instruments embedded in the circuit usable. This is especially important for complex boards with greatly reduced physical access.

Due to its optimized price/performance ratio, it can also be used in very cost-sensitive applications, with full support from the integrated JTAG/Boundary Scan software platform SYSTEM CASCON. Due to its compatibility with the more powerful SCANFLEX II platform, the test programs can be transferred directly.


  • 2 independent, true parallel Test Access Ports (TAP)
  • 16 MHz maximum TCK frequency
  • 32 Mixed Signal I/O
  • USB 2.0/GBit LAN host interface
  • Use in laboratory and production
  • Use as desktop module or for integration into other system environments

Embedded JTAG Solutions Product Overview

ScanBooster II Datasheet

ScanFlex II Cube Datasheet

ScanFlex II Blade 4 Datasheet

CION LX Datasheet