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Vantage Series

The cyberTECHNOLOGIES Vantage range of non‑contact 2D and 3D measurement systems are widely used in production, laboratory and cleanroom environments for applications in microelectronics and other precision industries.

Utilising the SCAN CT software package, with triangulation, confocal point white light or laser sensor technology, the operator is able to perform a host of surface measurements particularly suited to microelectronics environments.

With resolutions to 0.01 μm, and measurement ranges to 8 mm, the Vantage products offer a cost effective 2D solution, or fully motorized 3D  solutions for thickfilm, solar cell, flatness, coplanarity, laser scribing depth and roughness measurement and much more.

Vantage 50 non‑contact 2D profiling system

The cyberSCAN VANTAGE 50 is a compact,...

Vantage 50

Vantage 50 non‑contact 2D profiling system

The cyberSCAN VANTAGE 50 is a compact, cost effective 2D non‑contact profiling system for fast scanning of any part or surface in either a laboratory or production environment. Applications for this product include assessment of laser scribing, height measurement of solar cells, and thick film height measurement on hybrid circuits.

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Vantage 2 non‑contact 2D and 3D compact profilometer

Designed for use in clean...

Vantage 2

Vantage 2 non‑contact 2D and 3D compact profilometer

Designed for use in clean rooms and production environments, the Vantage 2 is a compact enclosed 2D and 3D profilometer providing a motorized x and y axis platform allowing scanning over 200 mm suited to measuring thick film  substrates, solar applications and 8 inch wafers

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