Vantage 1

Compact 2D Profilometer

Vantage 1  non‑contact 2D profiling system

The VANTAGE 1 is a compact, cost effective 2D non‑contact profiling system for fast scanning of any part or surface in either a laboratory or production environment. Applications for this product include assessment of laser scribing, height measurement of solar cells, and thick film height measurement on hybrid circuits.

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Compact 2D Profilometer

CyberTECHNOLOGIES Vantage 1

The cyberSCAN VANTAGE 1 is a compact, noncontact high-resolution profiling system for fast scanning of any part or surface.
The system combines a laser sensor, a base unit with an integrated translation stage and a PC or a laptop for data analysis.

 

[code_icon_text icon=”icon: hand-pointer-o”]Measurement and Analysis Modes :

Manual / Semi-Automated [/code_icon_text]

[code_icon_text icon=”icon: expand”]Measurement Length :

50 mm [/code_icon_text]

[code_icon_text icon=”icon: cube”]Use-Case Examples :

Roughness, thick film and step height measurement on substrates, pads, PCBs[/code_icon_text]

 

Measure with Ease

The VANTAGE 1 is a 2D Profilometer for high-resolution measurement on a length up of 50 mm.
Easy to handle and fast to measure to get high-accurate results in no time.

  • Z-Axis
  • X-Axis
  • Built-In Camera

 

The system features a 45 mm z-axis to adjust for different samples heights. The optional automated Z-axis provides autofocus functionality and includes a range extender to measure heights beyond the sensor’s standard measurement range.
The VANTAGE 1 is equipped with an automatic scan axis featuring 50-nanometer encoders for highly precise scans over lengths of up to 50 mm. Measure surfaces with exceptional accuracy, achieving lateral measurement point spacing down to one micrometer.
Focus on what matters. The system features a built-in camera with multiple magnification options, allowing you to easily navigate on your samples or choose the sensor’s scanning area in live view. Additionally, the camera enables quick and automated fiducial alignment.

 

  • Profile Measurement
  • 2D Analysis
  • Data Operations
  • Automation

Easily select profile position in live view and adjust settings in a few clicks.

Select measurement or reference regions and choose from 100+ 2D analyses.

Prepare scans and data for precise analysis with templates for recurring measurements

Steamline your recurring measurements and analysis with semi-automation, providing an instant overview of results.

 

 

  • Z-Axis
  • X-Axis
  • Built-In Camera
The system features a 45 mm z-axis to adjust for different samples heights. The optional automated Z-axis provides autofocus functionality and includes a range extender to measure heights beyond the sensor’s standard measurement range.
The VANTAGE 1 is equipped with an automatic scan axis featuring 50-nanometer encoders for highly precise scans over lengths of up to 50 mm. Measure surfaces with exceptional accuracy, achieving lateral measurement point spacing down to one micrometer.
Focus on what matters. The system features a built-in camera with multiple magnification options, allowing you to easily navigate on your samples or choose the sensor’s scanning area in live view. Additionally, the camera enables quick and automated fiducial alignment.

Vantage 50 Datasheet

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