Vantage 2

3D Profilometer

Vantage 2 non‑contact 2D and 3D compact profilometer

Designed for use in clean rooms and production environments, the Vantage 2 is a compact enclosed 2D and 3D profilometer providing a motorized x and y axis platform allowing scanning over 200 mm suited to measuring thick film  substrates, solar applications and 8 inch wafers

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3D Profilometer


The cyberSCAN VANTAGE 2 is a non-contact surface metrology system. It combines high resolution confocal sensor technology with a x-  and y- translation stage.

The system can measure large areas up to 200 mm with maximum x, y, z resolution.

All electronic components are integrated into a robust housing, no cables or external controllers are required. The system is connected with a single USB cable to PC or workstation.

The proprietary and user friendly cyberTECHNOLOGIES Software offers sophisticated surface metrology analyses and automated measurement routines.

  • Fast and accurate magnetic linear motors
  • Measurement speed: 2 kHz / 4 kHz
  • 200 mm travel in x‑ and y‑direction, lateral resolution 0.05 µm
  • 2D profiles and 3D topographical maps (topography measurement)
  • Large scanning areas, up to the maximum travel of 200 mm with maximum x‑, y‑, z‑resolution
  • Motorized 50 mm z‑axis option
  • Chromatic white light sensors
  • High resolution camera

Vantage 2 Datasheet