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Flying Probe Testing

 

The TAKAYA APT series comprises test systems for the detection of production defects on assembled printed circuit boards using probes moving very fast independently of each other so that a conventional bed of nail adapter is no longer required.

As early as 1987, TAKAYA developed the concept of the Flying Probe Tester that combines the advantages of advanced electrical test methods and high-precision mechanics. Since that time, TAKAYA has been leading in the field of flying probe technology.

The research and development capacities concentrate on the fast launch of product innovations on the market to be able to react immediately to the rapidly changing technical requirements and needs of the customers in the many different areas of the electronics industry.

The Takaya APT-1400F is a next-generation flying probe test system which has...

APT-1400F

The Takaya APT-1400F is a next-generation flying probe test system which has unprecedented performance in terms of test speed, positioning accuracy and test coverage. Removing the requirement for a conventional bed-of-nails fixture and providing a wide variety of test facility will contribute largely to your R&D department and NPI section that ought to validate low-volume productions.

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The Takaya APT-9411 Flying Probe Tester easily adapts to both the OEM and CM environments...

APT-9411

The Takaya APT-9411 Flying Probe Tester easily adapts to both the OEM and CM environments while providing years of peak performance and reliable operation. In keeping with their reputation for quality, Takaya uses only the most reliable ball screw and slide rail mechanisms which have been designed for accuracy, stability and durability. This attention to detail is a major factor leading to the system’s superior positioning performance.

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