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Optimizing EMC and RF Test Chamber Design and Performance – Webinar

Optimizing EMC and RF Test Chamber Design and Performance – LIVE Free Webinar
Hosted by ETS-Lindgren and presented by the IEEE EMC Society.

Abstract: An EMC test chamber is a considerable investment impacted by many factors, a few of which include performance, space limitations, features, and budget. Most often, the budget drives a series of tradeoffs between the size of the quiet zone, partial absorber linings, and performance. One rarely encounters a “standard” chamber, thus some customization is inevitable. How do you lower the risk of a chamber not meeting your expectations? In this presentation, we provide an overview of the EMC chamber design process and highlight the importance of accurate EMC chamber simulation in meeting challenging design requirements. Case studies of four very different chambers will be shown, including predicted and validated performance data. Participants will gain a better appreciation of the technical challenges, limitations, speed, accuracy, and tradeoffs among the different simulation techniques. The presentation will also benefit those who wish to refurbish an existing chamber, those who have a chamber that struggles to meet site requirements and want to diagnose/correct the deficiencies, and those who want to understand how a chamber impacts measurement uncertainties.

DATE

Wednesday, June 16

Register Here

Speaker:
 Zhong Chen is the Director of RF Engineering with ETS-Lindgren, located in Cedar Park, Texas.
He has over 25 years of experience in RF testing, anechoic chamber design, as well as antenna and EMC field probe design and measurements.   He is currently a member of the Antenna Measurement Techniques Association (AMTA) Board of Directors.  Mr. Chen is the Chair of Subcommittee 1 of ANSI ASC C63 which is responsible for EMC antenna calibration and test site validation standards.   He is also chair of the IEEE Standard 1309 committee responsible for developing calibration standards for field probes, and IEEE Standard 1128 for absorber measurements.
He has served as a Distinguished Lecturer for the IEEE EMC Society.  His research interests include measurement uncertainty, time domain measurements, and development of novel RF absorber materials.
Mr. Chen received his M.S.E.E. degree in electromagnetics from the Ohio State University at Columbus.

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