SCANFLEX systems are controlled through a JTAG/Boundary Scan Controller. This controller is responsible for simultaneous generation and dynamic distribution of serial patterns, parallel patterns, and control sequences, supporting three standard SFX and SFX/LS Interfaces.
All SCANFLEX Controllers are available in three performance classes (A/B/C).
The product portfolio is being constantly expanded. Customer specific products are offered upon request.
SCANFLEX II Controller
Configurations available for SCANFLEX II CUBE / SCANFLEX II BLADE 4 / SCANFLEX II BLADE 4 RMx3 (3 Controller)
Configuration overview of the new generation
|PERFORMANCE||CLASS A||CLASS B||CLASS C|
|Max. TCK Frequency||20 MHz||50 MHz||100 MHz|
|Data processing||normal – Scan Data Buffer||fast – SPACE™ III architecture (up to 20 times faster)||fast – SPACE™ III architecture (up to 20 times faster)|
|Upgrade||FASTSCALE™ (Upgrade to Controller B or C)||FASTSCALE™ (Upgrade to Controller C)|
Extensions to the SCANFLEX II Controller
Systematically test the characteristics of a wide range of interfaces such as RS232, I2C and SPI or complex interfaces such as USB, LAN and media connections with the SFX II ITM (Interface Tester Master). The simultaneous interface test on several test objects is also supported.
See the “I/O Modules” tab for more info.