JTAG/Boundary Scan In-Circuit Tester Integration

Advantages of the Integration in In-Circuit-Tester

very fast total system consisting of Embedded JTAG Solutions and In-Circuit-Tester

very high fault coverage also for highly compact PCBs

reduction of nail bed adapter costs by saving test points

simple test program generation because each test technology is applied according to its core competence

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Integration of Embedded JTAG Solutions in In-Circuit-Tester (ICT)

In-Circuit-Test (ICT) is the most widespread technology at present because the principle allows all electrically detectable faults to be found. But its capability is becoming limited by access difficulties since components have become smaller, and because of more complex narrow width nets and multi-layer boards.

Embedded JTAG Solutions does not have access limitations. A combination is beneficial whenever mechanical access is difficult even though there may be a small number of Boundary Scan components on the PCB.

Additional Test Options at Board and System Level

Specially designed integration packages in various performance classes contain a hardware and software configuration tailored to the ATE (Automatic Test Equipment).
The functions of the SYSTEM CASCON software platform are integrated into the ATE software for Flying Probe Testers. A common error report completes the integration solution.

With this combination of test technologies, the user benefits from a multitude of additional test options at board and system level over the entire product life cycle. In contrast to individual systems, integration offers significant advantages in test coverage, diagnostic depth and process optimization.

Available for various ICT test systems such as: Digitaltest, Keysight, Rohde & Schwarz, Seica, SPEA, Teradyne, TRI, VIAVI.
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Goepel Boundary Scan Technologies Overview  
Goepel ESA Integration Brochure