Advantages of JTAG Integration in In-Circuit-Tester
Very fast total system consisting of Embedded JTAG Solutions and In-Circuit-Tester
Very high fault coverage also for highly compact PCBs
Reduction of nail bed adapter costs by saving test points
Simple test program generation because each test technology is applied according to its core competence
Additional Test Options at Board and System Level
Specially designed integration packages in various performance classes contain a hardware and software configuration tailored to the ATE (Automatic Test Equipment). The functions of the SYSTEM CASCON software platform are integrated into the ATE software for in-circuit testing. A common error report completes the integration solution.
With this combination of test technologies, the user benefits from a multitude of additional test options at board and system level over the entire product life cycle. In contrast to individual systems, integration offers significant advantages in test coverage, diagnostic depth and process optimization.
