Vantage 1 non‑contact 2D profiling system
The VANTAGE 1 is a compact, cost effective 2D non‑contact profiling system for fast scanning of any part or surface in either a laboratory or production environment. Applications for this product include assessment of laser scribing, height measurement of solar cells, and thick film height measurement on hybrid circuits.
CyberTECHNOLOGIES Vantage 1
The cyberSCAN VANTAGE 1 is a compact, noncontact high-resolution profiling system for fast scanning of any part or surface.
The system combines a laser sensor, a base unit with an integrated translation stage and a PC or a laptop for data analysis.
Measure with Ease
The VANTAGE 1 is a 2D Profilometer for high-resolution measurement on a length up of 50 mm.
Easy to handle and fast to measure to get high-accurate results in no time.
Easily select profile position in live view and adjust settings in a few clicks.
Select measurement or reference regions and choose from 100+ 2D analyses.
Prepare scans and data for precise analysis with templates for recurring measurements
Steamline your recurring measurements and analysis with semi-automation, providing an instant overview of results.
Vantage 50 Datasheet 
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