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Vantage 50

Vantage 50 non‑contact 2D profiling system

The cyberSCAN VANTAGE 50 is a compact, cost effective 2D non‑contact profiling system for fast scanning of any part or surface in either a laboratory or production environment. Applications for this product include assessment of laser scribing, height measurement of solar cells, and thick film height measurement on hybrid circuits.

Description

CyberTECHNOLOGIES Vantage 50

The cyberSCAN VANTAGE 50 is a compact, noncontact profiling system for fast scanning of any part or surface. The system combines a laser sensor, a base unit with an integrated translation stage and a PC or a laptop for data analysis.

The sensor scans over the object and produces a high‑resolution height profile. The confocal laser sensor can also produce a scan line with the width of 1.1 mm and a lateral resolution of 2 μm. In combination with the translation stage a highly accurate 3D raster can be recorded. The software offers sophisticated surface metrology analyses and automated measurement routines.

  • Cost‑effective profilometer and 3D scanning solution
  • Integrated motion system with 50mm travel
  • User friendly concept
  • Sophisticated analysis and automation software
  • Integrated y‑stage with sensor mount
  • 50 mm travel in y‑ direction, lateral resolution 0.05 μm
  • Laser confocal or triangulation sensors
  • Resolution down to 0.01 μm, measurement range up to 8 mm
  • 3D Line‑scan capabilities (laser confocal sensor) with 1.1 mm width and 2 μm lateral resolution
  • 2D profiles and 3D topographical maps
  • Integrated on‑axis camera, visible laser spot inside the camera field of view

Vantage 50 Datasheet