Vantage 50


Vantage 50 non‑contact 2D profiling system

The cyberSCAN VANTAGE 50 is a compact, cost effective 2D non‑contact profiling system for fast scanning of any part or surface in either a laboratory or production environment. Applications for this product include assessment of laser scribing, height measurement of solar cells, and thick film height measurement on hybrid circuits.

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CyberTECHNOLOGIES Vantage 50

The cyberSCAN VANTAGE 50 is a compact, noncontact profiling system for fast scanning of any part or surface. The system combines a laser sensor, a base unit with an integrated translation stage and a PC or a laptop for data analysis.

The sensor scans over the object and produces a high‑resolution height profile. The confocal laser sensor can also produce a scan line with the width of 1.1 mm and a lateral resolution of 2 μm. In combination with the translation stage a highly accurate 3D raster can be recorded. The software offers sophisticated surface metrology analyses and automated measurement routines.

  • Cost‑effective profilometer and 3D scanning solution
  • Integrated motion system with 50mm travel
  • User friendly concept
  • Sophisticated analysis and automation software
  • Integrated y‑stage with sensor mount
  • 50 mm travel in y‑ direction, lateral resolution 0.05 μm
  • Laser confocal or triangulation sensors
  • Resolution down to 0.01 μm, measurement range up to 8 mm
  • 3D Line‑scan capabilities (laser confocal sensor) with 1.1 mm width and 2 μm lateral resolution
  • 2D profiles and 3D topographical maps
  • Integrated on‑axis camera, visible laser spot inside the camera field of view

Vantage 50 Datasheet