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TTSM

TTSM Table Top Shadow Moiré

The TTSM (Table Top Shadow Moiré) Metrology System provides ultra fast surface topography for substrates up to 330mm x 330mm. Utilizing Akrometrix’s patented Shadow Moiré technology, the TTSM is designed for those customers who need to measure various substrates for it’s warpage in less than 2 seconds. With a z-resolution of 1.25 microns, the TTSM can be placed on a table for quick and easy measurements utilizing Akrometrix’s suite of software programs to allow for a variety of useful features to optimize and provide meaningful reports.

The TTSM (Table Top Shadow Moiré) Metrology System provides ultra fast surface topography for substrates up to 330mm x 330mm. Utilizing Akrometrix’s patented Shadow Moiré technology, the TTSM is designed for those customers who need to measure various substrates for it’s warpage in less than 2 seconds. With a z-resolution of 1.25 microns, the TTSM can be placed on a table for quick and easy measurements utilizing Akrometrix’s suite of software programs to allow for a variety of useful features to optimize and provide meaningful reports.

The TTSM can handle virtually any substrate and can accommodate either a 300mm wafer or 2 JEDEC trays. And with Akrometrix’s part tracking software – it can automatically detect repeating sizes of devices and report them individually. Weighing only 70 lbs, the TTSM is perfect for those labs or manufacturing areas who need a quick and reliable method to determine the warpage of various substrates.

Digital Fringe Projection
Digital Image Correlation
Shadow Moiré

Akrometrix Studio is an advanced set of integrated software modules that work together to run all Akrometrix equipment. The Studio software suite takes users from profile creation, through warpage measurement, temperature profiling, analysis of warpage data, and reporting seamlessly. Studio software users will have nearly the same experience in working with different Akrometrix measurement technologies and different Akrometrix measurement tools.

The Studio Suite is broken up into a series of programs that work together

Profile Generator: (Create temperature profiles)
Surface Measurement: (Measurement Setup)
Thermal Profiler: (Measure warpage over temperature)
Surface Analysis: (In-depth data processing)
Interface Analysis: Understanding Warpage Between Two Mating Surfaces
Real Time Analysis for Pass/Warning/Fail Decisions
Part Tracking

Akrometrix General Brochure