Flying Probe Testing

The TAKAYA APT series comprises test systems for the detection of production defects on assembled printed circuit boards using probes moving very fast independently of each other so that a conventional bed of nail adapter is no longer required.

As early as 1987, TAKAYA developed the concept of the Flying Probe Tester that combines the advantages of advanced electrical test methods and high-precision mechanics. Since that time, TAKAYA has been leading in the field of flying probe technology.

The research and development capacities concentrate on the fast launch of product innovations on the market to be able to react immediately to the rapidly changing technical requirements and needs of the customers in the many different areas of the electronics industry.