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Teseq NSG 3040A multifunctional test generator

Multifunction Generator Systems – The Smart 4.8 kV Solution For CE Applications

  • One box solution system for immunity testing
  • Surge voltage to 4.8 kV
  • EFT/Burst to 4.8 kV / 1 MHz
  • PQT to 16 A / 300 VAC & DC
  • Easy to use 7“ color touch screen
  • Parameters can be changed while test is running
  • Wide range of optional test accessories

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If you want to know more about Teseq NSG 3040A multifunctional test generator

Teseq’s new NSG 3040A is an easy-to-use multifunction generator that simulates electromagnetic
interference effects for immunity testing in conformity with international, national and manufacturers’ standards including the latest IEC/EN standards. The NSG 3040A multifunctional test generator system is designed to fulfill conducted EMC test requirements for CE mark testing, which generally include combination wave surge, Electrical Fast Transient (EFT) pulses and Power Quality Testing (PQT). Extensive expansion capabilities enable the system to be configured for a much broader range of applications.

Featuring an innovative, modular design, the NSG 3040A multifunctional test generator is a versatile system that can be configured for basic testing needs and expanded to meet the needs of sophisticated test laboratories.

Using state-of-the-art components, the self-contained modules set new standards with respect to switching and phase accuracy and exceed the existing standards’ requirements.
A 7” touch panel display with superb contrast and color makes controlling the NSG 3040A multifunctional test generator easy. For fast and efficient data entry, input devices include an integrated keyboard and a thumbwheel with additional keys for sensitivity adjustment. To achieve quick, reliable results in a development environment a standardized test can be initiated with just a few “clicks” using the integrated Test Assistance (TA) function.

Convenient touch input buttons make each parameter’s value highly visible and allow the user to quickly select and modify all settings. A stylus is not necessary, and ramp functions can be programmed quickly and easily. Multi-step test procedures can be created and their sequence or parameter values can be changed easily.

With expert mode users can make manual parameter changes using the thumbwheel while a test is under way, providing an effective and fast method for identifying critical threshold values.
The NSG 3040A multifunctional test generator has an Ethernet port for external PC control. The Windows-based control software simplifies test programming and compilation of complex test sequences with various types of tests.

Test reports can be generated during the test operation, allowing the operator to enter observations as the test progresses and increasing the efficiency of long-term tests.

Combination wave pulse 1, 2/50 – 8/20 μs (Hybrid-Surge pulse)
Pulse conforms to IEC/EN 61000-4-5

Parameter Value
Pulse voltage (open circuit) ±200 V to 4.8 kV (in 1 V steps)
Pulse current (short circuit) ±100 A to 2.4 kA
Impedance 2/12 Ω
Polarity positive / negative / alternate
Pulse repetition 10 s, up to 9’999 s (in 1 s steps)
Test duration 1 to 99’999 pulses, continuous
Phase synchronization asynchronous, synchronous 0 to 359º (in 1º steps)
Coupling IEC (external / internal)

Burst (EFT) 5/50 ns
Pulse conforms to IEC/EN 61000-4-4

Parameter Value
Pulse amplitude ±200 V to 4.8 kV (in 1 V steps) – open circuit
±100 V to 2.4 kV (50 Ω matching system)
Burst frequency 100 Hz to 1000 kHz
Polarity positive / negative / alternate
Repetition time 10 ms to 9’999 s
Burst duration 10 μs to 9’999 s, single pulse
Test duration 1 s to 9’999 s, 1 min to 1600 min, endless
Phase synchronization asynchronous, synchronous 0 to 359º (in 1º steps)
Coupling external / internal

Dips, Interrupts & Variations
Conforms to IEC/EN 61000-4-11, IEC/EN 61000-4-29

Parameter Value
Dips, Interrupts & Variations From EUT voltage input to 0 V, 0%
Uvar with optional variac depending on model (VAR 3005A)
Uvar with step transformer 0, 40, 70, 80% (INA 650x)
Peak inrush current capability >500 A (at 230 V)
Switching times 1 to 5 μs (100 Ω load)
Event time (T-Event) 20 µs to 9’999 s, 0.5 to 9’999 cycles
Repetition time 10 ms to 9’999 s, 1 to 9’999 s
Test duration 1 to 99’999 events, continuous
Phase synchronization asynchronous, synchronous 0 to 359º (in 1º steps)

Variation test (with VAR 3005A only)
conforms to IEC/EN 61000-4-11

Parameter Value
Uvar with optional variac up to approx. 265 V (in 1 V steps) or up to 115% Uin (in 1% steps)
Decreasing time Td 1 ms to 9.999 s, 0.5 to 9999 cycles, abrupt
UTime at reduced voltage Ts 1 ms to 9.999 s, 0.5 to 9999 cycles
Increasing time Ti 1 ms to 9.999 s, 0.5 to 9999 cycles
Repetition time 1 to 5 μs (100 Ω load)
Events 1 to 99’999

Pulsed magnetic field in conjunction with 702A
conforms to IEC/EN 61000-4-9

Parameter Value
Field 100 to 1200 A/m
Polarity positive / negative / alternate
Repetition time 10 s to 9999s (in 1 s steps)
Impedance 2 Ω
Coil / impedance factor 0.01 to 100.00
Test duration 1 to 9’999 pulses, endless
Phase synchronization asynchronous, synchronous 0 to 359º (in 1º steps)

Power magnetic field in conjunction with MFT 30 or MFO 6501 and MFC 30 & MFC 300
conforms to IEC/EN 61000-4-8

Parameter Value
Field 1 to max. 40 A/m
Frequency 50 or 60 Hz
Coil factor 0.01 to 100
Test duration 1 s to 99’999 s, endless

Refer to to the NSG 3040A datasheet on the Downloads tab for complete and detailed parameter descriptions.

16A models 300V

NSG 3040A – IEC    Burst, Surge, Powerfail

NSG 3040A – EFT    Burst

NSG 3040A – CWS    Surge

NSG 3040A – DDV    Powerfail

NSG 3040A – EFT-CWS    Burst & Surge

  • UN ECE R10 (Automotive)
  • IEC/EN 61000-4-4
  • IEC/EN 61000-4-5
  • IEC/EN 61000-4-8
  • IEC/EN 61000-4-9
  • IEC/EN 61000-4-11
  • IEC/EN 61000-4-29
  • ANSI/IEEE C62.41
  • EN 61000-6-1
  • EN 61000-6-2
  • EN 50370
  • EN 61643
  • EN 300386-2
  • EN 300386 V1.3.2
  • EN 301489-1
  • EN 301489-7
  • EN 301489-17
  • EN 301489-24
  • IEC 60255-1
  • IEC 60601-1-2
  • IEC 61326
  • IEC 61850-3
  • ITU-T K.12
  • ITU-T K.20
  • ITU-T K.21
  • ITU-T K.28
  • ITU-T K.41
  • ITU-T K.44
  • ITU-T K.45

Teseq NSG 3040A Datasheet 

CDN 3043A-C32

Three phase automatic coupling decoupling network, 3×480 V / 32 A

CDN 3425

Burst/EFT Coupling Clamp for dataline coupling.

CDN 117A-C5-4-1

Coupling networks for unsymmetrical signal-/data lines (surge)

CDN 118A-C5-4-1

Coupling networks for symmetrical signal-/data lines (surge)

CDN HSS-2

Coupling Decoupling Network for 2kV surge pulse 1.2/50μs IEC/EN 61000-4-5 on unshielded symmetrical high speed telecom lines (ethernet)

PVF BKIT 1

Burst/EFT verification set

MD 210

Voltage differential probe  3.5 kV / 7 kV

MD 300

Current probe 5 kA

TVT 1-250-16

Manual step transformer, 16Aac, 0/40/70/80%

VAR 3005A-S16

Automatic single variable transformer, 1 x 16 A

MFO 6501A

Manual magnetic field option for -4-8

MFC 30

Magnetic field coil 1 x 1 m , with MFO max. 40 A/m -4-8;
Surge max. 1200 A/m -4-9

MFC 300

Magnetic field coil 1 x 1 m; max. 330 A/m -4-8